Equipment
The equipment of the department “Instrumental Structure Analysis” includes various methods of light and electron microscopy.
Transmission electron microscope
Photo: Hereon/general
Tecnai G2 F20 (Fei)
• 200kV, Field emission gun
• EFTEM, EELS (GIF2002, Gatan)
• STEM
• EDX-Analysis (EDAX)
• HAADF (Fischione)
• Cryotransfer specimen holder
• Tomography
Scanning electron microscope
Photo: Hereon/general
Merlin (Zeiss)
• 30kV, Field emission gun
• Detectors: SE, BSE, EsB, STEM
• EDX
Scanning electron microscope
Photo: Hereon/general
LEO Gemini 1550 VP (Zeiss)
• 30kV, FEG
• Detectors: SE, BSE
• EDX-Analysis (EDAX)
Atomic force microscope
Photo: Hereon/general
MultiMode 8 (Bruker)
• Nanoscope Controller V
• Measuring Modes
- Tapping Mode®
- Contact Mode
- PeakForce Modes
- ScanAsystTM
- Conductive AFM
- Kelvin Probe AFM
- Tunneling AFM
• Accessories
- Temperature Control: -35°C to 250°C
- Fluid cell, Gas cell
- ScanAsystTM HR
Leica light-optical microscope
Photo: Hereon/general
Leica DMLM
• Reflected / transmitted light
• Objectives:10x, 20x, 50x, 100x
• Phase contrast
• Heating / cooling table
• Temperature control system TMS94 (Linkam)
-196°C to 600°C
Raman microscope (dispersive)
Photo: Hereon/general
Senterra (Bruker)
• excitation laser: 785nm and 532nm
• Objective lens: 10x, 20x, 50x, 100x