Methods
Analytic Methods
| Method | Instrumental setup / configuration |
| Scanning Electron Microscopy, Imaging and X-ray Analysis (EDX) | Topographic contrast: Inlensdetector, Everhard- Thornley detector; compositional and topographic contrast: backscattered electron detector; STEM-in-SEM extension. Non conductive samples: LV-mode from 100 eV and VP-mode up to 100 Pa and 25 keV (VPSE- und BSE-detector). EDX starting at boron |
| Scanning Force Microscopy Tapping Mode, Contact mode, Interleave Mode, Force Volume Mode | NanoScope IIIa (Veeco) equipped with MMHC-35-250, NanoScope V (Veeco) T = -35 - 250 °C |
| Optical Profilometry | Microprof 200 with chromatic sensor CWL 300 µm (FRT) |
| Digital microscopy | Digital microscope VHX-500 (Keyence) with zoom lenses VH-Z500, VH-Z150 and VH-Z25, 3D evaluation software |
| Surface tension polymer plates and cylinders | Tensiometer K12 and K14 (Krüss) |
| Contact angle and surface tension measurement Sessile Drop, Captive Bubble, Pendant Drop | Goniometer DAS 100 (Krüss) |
| Streaming potential measurement zeta potential | MES Microslit Electrokinetic Setup (IPF Dresden); microslit cell, cells for flat samples, powders and fibers |
| Impedance spectroscopy and dielectric spectroscopy | IM6 Impedance Spectrometer 10 µHz-8 MHz (Zahner); HP 4284A Precision LCR Meter 20 Hz - 1 MHz (Hewlett Packard); T = 25 -150°C. |
