Techniques and Equipment
| Equipment | Specifications |
| Hardness testing machine | Zwick ZHU2.5; for instrumental penetration tests with digital measurement, control, and regulation electronics, hardness measurement head range until 200N |
| Dualbeam SEM/FIB | FEI Nanolab200; for the micro structural characterisation and fabrication of small testing probes by Ga-ion beam, fitments e.g. EDXS und EBSD |
| Nano Indenter | MTS XP; for the conduction of nano and micro mechanical tests, fitments e.g. CSM, DCM, until 10N |
| Atomic Force Microscope | PISA XE-100E; for the investigation of surfaces. Fitments: separate x-y-z- scans, resolution: 0,05 nm in z and 0,1 nm in x-y direction, closed loop feedback |
