HARWI II
The new high-energy beamline HARWI-II is dedicated to texture, strain, and imaging measurements for materials science. The beamline layout including the beamline optics, the experimental stations, and the control hutch are presented in figure 1.
Figure 1: Beamline layout
Instrument description:
Front-end filter:
3 mm Carbon is permanently installed as a high pass filter in order to reduce the heat load onto the monochromator. For the hard X-ray options additionally either a 1 mm thick and 10 mm wide or a 2 mm thick and 70 mm wide copper filter can be inserted into the beam path. Both Cu filters withstand the thermal load with 10 mm carbon in front.
Monochromator setup:
Figure 2: Sketch of the monochromator setup
The monochromator tank (figure 2) accommodates two different types of monochromators. The first type of monochromator (type A) is a double Laue monochromator in horizontal geometry for strain and stress analysis and delivers beams of 10 mm ×10 mm in size. Both goniometers can hold a set of crystals. Using another pair of crystals is accomplished by linear stages on top of the goniometers. With the currently installed tempered Si(111) crystals an energy range of 65 - 200 keV can be reached with a dynamical rockimg width of 6 arcsec at 100 keV. The second monochromator is optimized for imaging experiments. This monochromator produces a beam size of up to 70 mm x 10 mm in a vertical diffraction geometry. The energy range will be 20 to 150 keV. Furthermore a direct white beam of about 0.5 mm x 0.5 mm can be provided for experiments.
Experiments:
In the experimental hutches three pits are lined up along the beam. The pits houses the different experiments. One of the experiments is a heavy duty diffractometer which is specially designed for high photon energies studies. The diffractometer is
installed in pit 1 (see figure 1).
Figure 3: Heavy duty diffractometer
It is equipped with various translation, rotation, and tilt stages. The tower is large enough to carry heavy samples and heavy user environments up to 600 kg. The incoming and scattered beam can be defined by slit systems attached to the diffractometer. Diffracted photons can be detected with two position sensitive two-dimensional gas-wire counter each with an active area of 300 mm × 300 mm. The detectors can be mounted on two 2θ-arms for scattering in the vertical plane. The sample-detector distance is adjustable via additional translation stages which are mounted on the diffractometer arms. In addition, the detectors can be mounted on a large movable frame (see figure 4) in order to position them at any desired location behind the sample.
Figure 4: Detector portal
The maximum sample-detector distance can be up to 9 m. Thus measurements with high angular resolution can be performed. An energy-dispersive detector, a scintillation counter and image plate scanner are also available. Moreover, a flat panel detector is ordered. In order to perform in-situ residual stress analysis experiments an INSTRON stress rig (see figure 5) was set up. It works servo-hydraulically and is equipped with water-cooled clamps. The rig can be used in-situ or ex-situ, i.e. for long term experiments.
The second permanent experiment is a tomography station which is installed onto a lift table (figure 1 position 3). The tomography camera mainly consists of an efficient X-ray detector and a high-precision sample-manipulator stage. The two dimensional X-ray detector is specially equipped to detect the high-energy X-ray beam. The system is designed to operate with photon energies from 20-150 keV. Using an optic with variable focus the field of view can be adapted to the diameter of the investigated sample. Thus, spatial resolution up to 2 μm can be achieved by the tomography system. The sample-manipulator provides a high precision rotation, translation and reposition of the sample.
Figure 5: The INSTRON stress rig
Instrument Specification
| Wiggler parameters |
Period length λu : |
110 mm |
|
Minimum magnetic gap : |
14 mm |
|
Peak field B0 : |
1.91 T |
|
Number of periods : |
35 |
|
Deflection parameter Kmax (rms) : |
20.3 (13.4) |
|
Critical Energy Ec : |
26.7 keV |
|
Total power : |
29 keV |
| hor. Divergence |
30 keV : 3.4 mrad |
100 keV : 3.3 mrad |
| vert. Divergence |
30 keV : 0.15 mrad |
100 keV : 0.05 mrad |
| Stress rig parameters |
Hight : |
≈ 2500 mm |
|
Weight : |
≈500 kg |
|
Mechanical load : |
± 100 kN |
|
Cyclic loading : |
25 Hz at ± 1 kN |
|
Max. sample length : |
600 mm |
|
Max. sample thickness : |
16 mm |
|
Free viewing angle : |
± 80° |
Total flux from source at 100 keV : 4x1014 sec-1 in 0.1% BW
Literature on Instrumentation
Commissioning, New Developments and New Equipment at the Engineering Materials Science Beamline HARWI-II
New Developments for Tomographic Imaging at HARWI-II
Commissioning and first experiments at the Materials Science Beamline HARWI-II
A new wiggler for the HARWI-II Beamline
HARWI-II front-end filter design
Local Contact
Thomas Lippmann (Beamline Manager Diffraction)
Telefon: +49 (0)40 8998-5311
Telefax: +49 (0)40 8998-5399
E-Mail Kontakt
Felix Beckmann (Beamline Scientist Tomography)
Telefon: +49 (0)40 8998-5309
Telefax: +49 (0)40 8998-5399
E-Mail Kontakt
Link to DESY
HARWI-II